kw.\*:("DEFAILLANCE HUMAINE")
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SYSTEM RELIABILITY EVALUATION MODELS WITH HUMAN ERRORDHILLON BS.1983; IEEE TRANSACTIONS ON RELIABILITY; ISSN 0018-9529; USA; DA. 1983; VOL. 32; NO 1; PP. 47Article
PRISE EN COMPTE DE LA FIABILITE HUMAINE DANS LA CONCEPTION DES CENTRALES NUCLEAIRES = TAKING ACCOUNT OF HUMAN RELIABILITY IN NUCLEAR POWER PLANT DESIGNPROUILLAC; LERAT; JANOIR et al.1981; REVUE GENERALE NUCLEAIRE; ISSN 0335-5004; FRA; DA. 1981; NO 5; PP. 434-440Article
PRISE EN COMPTE DU FACTEUR HUMAIN DANS LA SURETE DES INSTALLATIONS NUCLEAIRES = TAKING ACCOUNT OF HUMAN FACTOR IN NUCLEAR PLANT SAFETYGRIFFON FOUCO; GAGNOLET M.1981; REVUE GENERALE NUCLEAIRE; ISSN 0335-5004; FRA; DA. 1981; NO 5; PP. 446-455Article
Reliability analysis of networks with human errors: a block diagram approachDHILLON, B. S; RAYAPATI, S. N.Microelectronics and reliability. 1987, Vol 27, Num 6, pp 981-999, issn 0026-2714Article
Reliability analysis of a two state repairable parallel redundant system under human failureGUPTA, P. P; RAKESH KUMAR SHARMA.Microelectronics and reliability. 1986, Vol 26, Num 2, pp 221-224, issn 0026-2714Article
Cost study of a complex system under waitingGUPTA, P. P; KUMAR, A.Microelectronics and reliability. 1986, Vol 26, Num 6, pp 1051-1054, issn 0026-2714Article
Point-wise availability of a two-unit standby redundant electronic equipment under human failureGUPTA, P. P; ARVIND KUMAR.Microelectronics and reliability. 1986, Vol 26, Num 2, pp 225-228, issn 0026-2714Article
Approches d'une théorie des défaillances = Approaches to a theory of failureCriqui, Jean-Georges; Barreau, H.1995, 367 p.Thesis
Human error and common-cause failure modelling of redundant systemDHILLON, B. S; RAYAPATI, S. N.Microelectronics and reliability. 1986, Vol 26, Num 6, pp 1139-1162, issn 0026-2714Article
Reliability and MTTF analysis of a non repairable parallel redundant complex system under hardware and human failuresGUPTA, P. P; ARVIND KUMAR.Microelectronics and reliability. 1986, Vol 26, Num 2, pp 229-234, issn 0026-2714Article
Availability and MTTF analysis of a three-state parallel redundant multi-component system under critical human failuresGUPTA, P. P; RAKESH KUMAR SHARMA.Microelectronics and reliability. 1986, Vol 26, Num 1, pp 63-68, issn 0026-2714Article
MTTF and availability evaluation of a two-unit, two-state, parallel redundant complex system with constant human failureGUPTA, P. P; ARVIND KUMAR.Microelectronics and reliability. 1986, Vol 26, Num 1, pp 53-56, issn 0026-2714Article
M.T.T.F. and availability evaluation of a two-unit, two-state, standby redundant complex system with constant human failureGUPTA, P. P; LOKESH TYAGI.Microelectronics and reliability. 1986, Vol 26, Num 4, pp 647-650, issn 0026-2714Article
Reliability analysis of a repairable parallel system with standby involving human error and common-cause failuresWHO KEE CHUNG.Microelectronics and reliability. 1987, Vol 27, Num 2, pp 269-271, issn 0026-2714Article
Strukturelle Überforderung psychischer Leistungsfähigkeit : Das Beispiel Tiefflug = Structural excessive strain of psychological resources: the example of low-level flightMOHR, W.Psychologische Rundschau. 1991, Vol 42, Num 3, pp 113-128, issn 0033-3042, 16 p.Article